PRESENTATION
Scanning Electron Microscope
LOCATION
Room: 2.1.15 Computer name: [computer name / ip] (why?)
COST
For sample preparation and imaging: contact Telmo Nunes.
FEATURES
Images Modes: Secondary Electron Image (SEI); Backscattered Electron Image (BEI)
Resolution: 5,5 nm (SEI: 25 kV, Working Distance (WD) = 10 mm)
Magnification: 15X (WD = 28mm) to 200000X (25 steps)
Acceleration Voltage: 1, 2, 5, 10, 15, 20, 25 kV
Digital Image Acquisition
PEOPLE RESPONSIBLE FOR THE EQUIPMENT
Telmo Nunes
FCUL
Microscopy technician
mevarrimento@fc.ul.pt
Room 2.1.15
Ext: 22181