JEOL JSM-5200LV (SEM)

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PRESENTATIONJEOL_JSM-5200LV

Scanning Electron Microscope


LOCATION

Room: 2.1.15 Computer name: [computer name / ip] (why?)


COST

TBA


FEATURES

Images Modes: Secondary Electron Image (SEI); Backscattered Electron Image (BEI)

Resolution: 5,5 nm (SEI: 25 kV, Working Distance (WD) = 10 mm)

Magnification: 15X (WD = 28mm) to 200000X (25 steps)

Acceleration Voltage: 1, 2, 5, 10, 15, 20, 25 kV

Digital Image Acquisition


PEOPLE RESPONSIBLE FOR THE EQUIPMENT

TelmoTelmo Nunes

FCUL

Microscopy technician

mevarrimento@fc.ul.pt

Room 2.1.15

Ext: 22181